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Failure of epicardial pacing leads in congenital heart disease: not uncommon and difficult to predict

机译:心外膜起搏失败会导致先天性心脏病:并不少见且难以预测

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摘要

AIMS: We evaluate the incidence of epicardial lead failure and try to identify risk factors in patients with congenital heart disease. METHODS: All patients with a congenital heart defect and an epicardial pacing system, implanted within a timeframe of 25 years, were included in this study. Patients' medical records and lead data were reviewed. Lead failure was defined as the primary endpoint. RESULTS: In total 198 active epicardial leads (atrial 40, ventricular 158) were implanted in 93 patients (median age at implantation 4.4 years (range 0-58.6)). During a total follow-up of 1235 lead-years, 29 lead failures (14.6%, 4 atrial, 25 ventricular) were documented in 22 patients (23.7%). Lead failure occurred at a median time period of 4.8 years (range 1.2-24.1) after implantation. Five-year freedom of lead failure was 88%. The only independent predictor for lead failure was the age at implantation (HR 0.44; 95%CI 0.20-0.97, p = 0.04), other characteristics failed to predict lead failure. Sudden cardiac death occurred in four patients (4.3%), in one a lead failure was documented. CONCLUSION: A high incidence of epicardial lead failures is found in patients with congenital heart disease. Unfortunately, it is difficult to predict this potentially life-threatening complication.
机译:目的:我们评估心外膜导联失败的发生率,并尝试确定先天性心脏病患者的危险因素。方法:所有患有先天性心脏缺陷和心外膜起搏系统的患者均在25年内植入本研究。审查了患者的病历和线索数据。引导失败定义为主要终点。结果:总共93例患者植入了198条活动性心外膜导线(心房40条,心室158条)(植入时的中位年龄为4.4岁(范围为0-58.6))。在总共1235个铅年的随访中,有22例患者(23.7%)记录了29例铅失败(14.6%,4例房颤,25例心室)。植入后的中位时间为4.8年(范围1.2-24.1)。五年无铅失败率为88%。铅失效的唯一独立预测因子是植入时的年龄(HR 0.44; 95%CI 0.20-0.97,p = 0.04),其他特征未能预测铅失效。四名患者(4.3%)发生心源性猝死,其中一例导致铅衰竭。结论:先天性心脏病患者心外膜导联失败的发生率很高。不幸的是,很难预测这种潜在的威胁生命的并发症。

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